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Development and performance-testing of Multi-Path I/O algorithms on V-Series systems

机译:V系列系统上多路径I / O算法的开发和性能测试

摘要

As data growth continues to accelerate, so must performance and efficiency of large scale storage systems. This project will present the implementation and performance analysis of Multi-Path I/O within Data ONTAP. The goal of this feature is to take advantage of redundant paths that were previously utilized only in failure situations. The paper will address the core mechanisms that comprise the MPIO handling within the system. Furthermore it will present the difficulties of testing such a feature in a shared lab environment. The initial expectation that MPIO would provide a small performance gain, in addition to better failure handling properties, was affirmed in the results. Under heavy I/O loads, MPIO systems showed an average of 5% throughput improvement over the older single-path implementation.
机译:随着数据增长的继续加快,大型存储系统的性能和效率也必须提高。该项目将介绍Data ONTAP中多路径I / O的实现和性能分析。此功能的目标是利用以前仅在故障情况下使用的冗余路径。本文将介绍构成系统内MPIO处理的核心机制。此外,它将带来在共享实验室环境中测试此类功能的困难。结果肯定了最初的期望,即MPIO除了具有更好的故障处理特性外,还将提供较小的性能提升。在较重的I / O负载下,MPIO系统的吞吐量比旧的单路径实现平均提高了5%。

著录项

  • 作者

    TerBush Ryan (Ryan T.);

  • 作者单位
  • 年度 2013
  • 总页数
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类

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