首页> 外文OA文献 >Ultralow-Temperature Measurements of Submicron Devices Nanometer-Scale Semiconductor Devices

【2h】

Ultralow-Temperature Measurements of Submicron Devices Nanometer-Scale Semiconductor Devices

机译：亚微米器件纳米级半导体器件的超低温测量

页面导航

摘要
著录项
相似文献
相关主题

摘要

Contains project goals.

机译：包含项目目标。

著录项

作者
Kastner Marc A.; Field Stuart B.; Scott-Thomas John H. F.; Meirav Udi; Park Samuel L.;
展开▼
作者单位

展开▼
年度 1987
总页数
原文格式 PDF
正文语种 en
中图分类

相似文献

外文文献
中文文献
专利

1. Strain evolution during the silicidation of nanometer-scale SiGe semiconductor devices studied by dark field electron holography [J] . David Cooper, Armand Beche, Jean-Michel Hartmann, Applied Physicsletters . 2010,第11期

机译：暗场电子全息图研究纳米级SiGe半导体器件硅化过程中的应变演化
2. Simulation of nanometer-scale semiconductor devices considering quantum effects [J] . Eiichi Sano International journal of RF and microwave computer-aided engineering . 2004,第3期

机译：考虑量子效应的纳米级半导体器件仿真
3. A comprehensive study of charge trapping in organic field-effect devices with promising semiconductors and different contact metals by displacement current measurements [J] . Bisoyi Sibani, Roedel Reinhold, Zschieschang Ute, Semiconductor science and technology . 2016,第2期

机译：通过位移电流测量对具有前景的半导体和不同接触金属的有机场效应器件中的电荷陷阱进行全面研究
4. TECHNIQUES OF INTERFERENCE REDUCTION IN PROBE SYSTEM FOR WAFER LEVEL NOISE MEASUREMENTS OF SUBMICRON SEMICONDUCTOR DEVICES [C] . L. Spiralski, A. Szewczyk, L. Hasse, NATO Advanced Research Workshop on Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices . 2004

机译：亚微米半导体器件晶片级噪声测量探针系统的干扰系统技术
5. Theoretical Study of Electron Transport in Nanometer-scale Compound Semiconductor Devices [D] . 水田, 博 1993

机译：纳米级化合物半导体器件中电子传输的理论研究
6. Semiconductors: Interface Design Principles for High‐Performance Organic Semiconductor Devices (Adv. Sci. 6/2015) [O] . Wanyi Nie, Gautam Gupta, Brian K. Crone, 2015

机译：半导体：高性能有机半导体器件的接口设计原理（Adv。Sci。6/2015）
7. Ultralow-Temperature Measurements of Submicron Devices [O] . Kastner Marc A., Field S., Licini C., 1987

机译：亚微米器件的超低温测量

Ultralow-Temperature Measurements of Submicron Devices Nanometer-Scale Semiconductor Devices

摘要

著录项

相似文献

相关主题

期刊订阅