Assessment of nano-patterned surfaces requires measurements with nano-metric resolution. In order to enable the optimization of the moulding process it is necessary to develop a robust method for quantitative characterization of the replication quality of random nano-patterned surfaces. In this work two different methods for quantitative characterization of random nano-patterned surfaces were compared and assessed. One method is based on the estimation of the roughness amplitude parameters Sa and Sz (ISO 25178). The second method is based on pore and particle analysis using the watershed algorithm for feature recognition. To compare the methods, the mould insert and a number of replicated nano-patterned surfaces, injection moulded with an induction heating aid, were measured on nominally identical locations by means of an atomic force microscope mounted on a manual CMM.
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