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Dual Polarized near Field Probe Based on OMJ in Waveguide Technology Achieving More Than Octave Bandwidth

机译:基于OmJ的双极化近场探头在波导技术中实现超过倍频带宽

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摘要

In classic probe-corrected spherical NF measurements, one of the main concerns is the probe [1], [2], [3]. Standard NF-FF transformation software applies probe correction with the assumption that the probe pattern behaves with μ=±1 azimuthal dependence. In reality, any physically realizable probe is just an approximation to this ideal case. Probe excitation errors, finite manufacturing tolerances and probe interaction with the mounting interface and absorbers are examples of uncertainties that can lead to presence of higher-order spherical modes in the probe pattern [4], [5]. Although probe correction techniques for high-order probes are feasible [6], they are highly demanding in terms of implementation complexity as well as in terms of calibration and post-processing time. In this paper, a new OMJ designed entirely in waveguide and capable of covering more than an octave bandwidth is presented. The excitation purity of the balanced feeding is limited only by the manufacturing accuracy of the waveguide. The paper presents the waveguide based OMJ concept including probe design covering the bandwidth from 18 to 40 GHz using single and dual apertures. The experimental validation is completed with measurements on the dual aperture probe at the DTU-ESA Spherical Near-Field facility in Denmark.
机译:在经典的探头校正球面NF测量中,主要关注的问题之一是探头[1],[2],[3]。标准NF-FF转换软件在假设探针模式的行为与μ=±1方位角相关的前提下应用探针校正。实际上,任何可物理实现的探针都只是此理想情况的近似值。探针激励误差,有限的制造公差以及探针与安装界面和吸收器的相互作用是不确定性的示例,这些不确定性可能导致探针图案中出现高阶球形模[4],[5]。尽管用于高阶探头的探头校正技术是可行的[6],但对实现复杂性以及校准和后处理时间的要求很高。在本文中,提出了一种全新的OMJ,它完全是在波导中设计的,能够覆盖超过八度的带宽。平衡馈电的激发纯度仅受波导制造精度的限制。本文介绍了基于波导的OMJ概念,包括使用单孔和双孔覆盖18至40 GHz带宽的探头设计。通过在丹麦的DTU-ESA球形近场设备上对双孔径探头进行测量,完成了实验验证。

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