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Ultrafast release and capture of carriers in InGaAs/GaAs quantum dots observed by time-resolved terahertz spectroscopy

机译:通过时间分辨太赫兹光谱观察到的InGaas / Gaas量子点中的载流子的超快释放和捕获

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摘要

We observe ultrafast release and capture of charge carriers in InGaAs/GaAs quantum dots in a room-temperature optical pump-terahertz probe experiment sensitive to the population dynamics of conducting states. In case of resonant excitation of the quantum dot ground state, the maximum conductivity is achieved at approximately 35 ps after photoexcitation, which is assigned to release of carriers from the quantum dots. When exciting carriers into the conduction band of the barriers, depletion of the conductivity via carrier capture into the quantum dots with a few picosecond pump fluence-dependent time constant was observed.
机译:我们在室温下的光泵太赫兹探针实验中观察到InGaAs / GaAs量子点中电荷载流子的超快释放和捕获,该实验对导电态的种群动态敏感。在共振激发量子点基态的情况下,在光激发后约35 ps处获得最大电导率,这被分配为从量子点释放载流子。当将载流子激发到势垒的导带中时,观察到通过载流子俘获进入量子点的电导率的损耗,皮秒依赖于泵浦注量的时间常数。

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