Azimuthal mode (m mode) truncation of a high-order probe pattern in probe-corrected spherical near-field antenna measurements is studied in this paper. The results of this paper provide rules for appropriate and sufficient m-mode truncation for non-ideal first-order probes and odd-order probes with approximately 10dBi directivity. The presented azimuthal mode truncation rules allow minimizing the measurement burden of the probe pattern calibration and reducing the computational burden of the probe pattern correction.
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