Fabrication and Test of Pixelated CZT Detectors with Different Pixel Pitches and Thicknesses

摘要

The main methods grown Cadmium Zinc Telluride (CZT) crystals with high yieldand excellent homogeneity are Modified Horizontal Bridgman (MHB) and HighPressure Bridgman (HPB) processes, respectively. In this contribution, thereadout system based on two 32-channel NCI-ASICs for pixellated CZT detectorarrays has been developed and tested. The CZT detectors supplied by Orbotech(MHB) and eV products (HPB) are tested by NCI-ASIC readout system. The CZTdetectors have an array of 8x8 or 11x11 pixel anodes fabricated on the anodesurface with the area up to 2 cm x2 cm and the thickness of CZT detectorsranges from 0.5 cm to 1 cm. Energy spectra resolution and electronmobility-lifetime products of 8x8 pixels CZT detector with differentthicknesses have been investigated.