A scanning probe-based pick-and-place procedure for assembly of integrated quantum optical hybrid devices

摘要

Integrated quantum optical hybrid devices consist of fundamental constituentssuch as single emitters and tailored photonic nanostructures. A reliablefabrication method requires the controlled deposition of active nanoparticleson arbitrary nanostructures with highest precision. Here, we describe an easilyadaptable technique that employs picking and placing of nanoparticles with anatomic force microscope combined with a confocal setup. In this way, both thetopography and the optical response can be monitored simultaneously before andafter the assembly. The technique can be applied to arbitrary particles. Here,we focus on nanodiamonds containing single nitrogen vacancy centers, which areparticularly interesting for quantum optical experiments on the single photonand single emitter level.