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Hard X-rays for processing hybrid organic-inorganic thick films.

机译:用于处理混合有机 - 无机厚膜的硬X射线。

摘要

Hard X-rays, deriving from a synchrotron light source, have been used as an effective tool for processing hybrid organic-inorganic films and thick coatings up to several micrometres. These coatings could be directly modified, in terms of composition and properties, by controlled exposure to X-rays. The physico-chemical properties of the coatings, such as hardness, refractive index and fluorescence, can be properly tuned using the interaction of hard X-rays with the sol-gel hybrid films. The changes in the microstructure have been correlated especially with the modification of the optical and the mechanical properties. A relationship between the degradation rate of the organic groups and the rise of fluorescence from the hybrid material has been observed; nanoindentation analysis of the coatings as a function of the X-ray doses has shown a not linear dependence between thickness and film hardness.
机译:源自同步加速器光源的硬X射线已被用作处理杂化有机-无机薄膜和厚涂层直至几微米的有效工具。通过控制暴露于X射线,可以在组成和性能方面直接修饰这些涂层。可以使用硬X射线与溶胶-凝胶杂化膜的相互作用来适当调节涂层的物理化学性质,例如硬度,折射率和荧光。微观结构的变化尤其与光学和机械性能的变化有关。已经观察到有机基团的降解速率和来自杂化材料的荧光的增加之间的关系;涂层的纳米压痕分析与X射线剂量的关系表明,厚度和膜硬度之间不存在线性关系。

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