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Ultrafast carrier dynamics in BiVO4 thin film photoanode material: interplay between free carriers, trapped carriers and low-frequency lattice vibrations

机译:BiVO4薄膜光电阳极材料中的超快载流子动力学:自由载流子,陷阱载流子和低频晶格振动之间的相互作用

摘要

We explore ultrafast carrier dynamics and interactions of photoexcited carriers with lattice vibrational modes in BiVO4 photoanode material using time-resolved terahertz spectroscopy and first-principles phonon spectrum calculations. We find that photoexcited holes form bound polaron states by introducing lattice distortion that changes phonon spectrum and suppresses the Ag phonon mode associated with opposite motion of Bi and VO4 molecular units. At excitation fluence higher than 1 mJ cm−2 (or 2 × 1015 cm−2 per pulse), lattice distortion due to self-localized holes alters the lattice symmetry and vibrational spectrum, resulting in bleaching of THz absorption by Ag phonons. Concurrently, we observe a short lived population of free carriers which exhibit Drude conductivity with mobility on the order of 200 cm2 V−1 s−1, orders of magnitude higher than typical carrier mobility in BiVO4. The anomalously high carrier mobilities are explained in the framework of a Mott transition. This demonstration of enhanced transport suggests how engineering BiVO4 photoanodes to take advantage of free carrier transport under high excitation conditions may in the future significantly enhance performance of photoelectrochemical devices.
机译:我们使用时间分辨太赫兹光谱和第一性原理声子谱计算,探索了BiVO4光阳极材料中超快载流子动力学和光激发载流子与晶格振动模式的相互作用。我们发现光激发空穴通过引入晶格畸变形成束缚的极化子态,该晶格畸变改变了声子谱并抑制了与Bi和VO4分子单元的反向运动相关的Ag声子模。在激发通量高于1 mJ cm-2(或每个脉冲2×1015 cm-2)时,由于自定位空穴引起的晶格畸变会改变晶格对称性和振动谱,从而导致Ag声子吸收THz吸收。同时,我们观察到短寿命的自由载流子,其载流子的德鲁伊电导率约为200 cm2 V-1 s-1,比BiVO4中的典型载流子迁移率高几个数量级。在莫特过渡的框架中解释了异常高的载流子迁移率。增强传输的这一例证表明,BiVO4光阳极工程化如何利用高激发条件下的自由载流子传输可能在将来显着增强光电化学设备的性能。

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