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Flip-chip bonding using laser induced ultrasonic vibration

机译:使用激光诱导的超声振动进行倒装芯片键合

摘要

Current thermosonic flip chip bonding technologies are adversely affected by chip-to-substrate co-planarity errors and bump/pad height variations which can lead to uneven bonding strength and, in extreme cases, chip cratering. This has limited the industrial uptake of thermosonic flip chip assembly. The aim of the research reported here was to explore the use of laser-generated ultrasound as an alternative ultrasound source in flip chip bonding. The research was motivated by the idea that, with greater control over the distribution of ultrasonic energy applied over the bonding interface, it should be possible to compensate for and mitigate the above effects.udThe main objective of this research work was to establish a working flip-chip bonding process using laser induced ultrasonic vibration. Initially, a literature review on current flip-chip bonding methods and laser ultrasonic methods was carried out. This suggested that confined laser ablation would be the most appropriate technique for generating strong ultrasonic vibration. Next, through modelling and simulation, an investigation was carried out to determine the suitable parameters and methods to be implemented during the experimental stage, including the pressure pulse amplitude, cavity width (irradiance spot size) and type of sacrificial material. Additional investigations were also carried out to explore the effect of applying different materials in generating ultrasonic vibration and also to show the effect of applying multiple pressure pulses simultaneously.udIn the experimental phase, a custom bonding rig was developed and used to explore the parameter space for thermosonic bonding on polymer substrates using ultrasound generated by a diode-pumped solid-state laser (355 nm wavelength). Initial experiments showed unstable bond strength due to the accumulation of heat which resulted in the appearance of an unwanted glue-like substance at the bonding interface. However, this issue was overcome through careful choice of process parameters combined with the introduction of off-axis laser irradiation. A process for bonding dummy test chips to flexible substrates was successfully established, and in the best case a die shear strength of 9.3 gf/bump was achieved.
机译:当前的热超声倒装芯片键合技术受到芯片与基板共面误差以及凸块/焊盘高度变化的不利影响,这会导致键合强度不均匀,在极端情况下还会导致芯片缩孔。这限制了热超声倒装芯片组件的工业应用。此处报道的研究目的是探索在倒装芯片焊接中使用激光产生的超声作为替代超声源。本研究的动机是,通过更好地控制施加在键合界面上的超声波能量的分布,应该有可能补偿和减轻上述影响。 ud本研究工作的主要目的是建立一个工作机制。倒装芯片焊接工艺利用激光诱导的超声波振动。最初,对当前的倒装芯片键合方法和激光超声方法进行了文献综述。这表明,有限的激光烧蚀将是产生强烈超声振动的最合适技术。接下来,通过建模和仿真,进行了一项调查,以确定在实验阶段要实施的合适参数和方法,包括压力脉冲幅度,腔体宽度(辐照斑尺寸)和牺牲材料的类型。还进行了其他研究,以探索应用不同材料产生超声振动的效果,并展示同时施加多个压力脉冲的效果。 ud在实验阶段,开发了定制的绑定装置并用于探索参数空间通过使用由二极管泵浦的固态激光器(355 nm波长)产生的超声波,在聚合物基材上进行热超声粘合。最初的实验表明,由于热量的积累,粘结强度不稳定,从而导致在粘结界面处出现不需要的胶状物质。但是,通过仔细选择工艺参数并引入离轴激光辐照可以解决此问题。成功建立了将虚拟测试芯片粘合到柔性基板上的方法,在最佳情况下,芯片的剪切强度达到了9.3 gf /凸块。

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    Nordin Mohd Hisham;

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  • 年度 2016
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