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Positronium emission and cooling in reflection and transmission from thin meso-structured silica films

机译:正电子发射和冷却反射和透过薄内结构二氧化硅薄膜

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摘要

Measurements of the positronium (Ps) energy and formation fraction in reflection and transmission from a thin meso-structured silica target have been conducted using single-shot positron annihilation lifetime spectroscopy and Doppler spectroscopy. The silica sample is made using glancing angle deposition of vaporized SiO2 on a suspended thin carbon foil. Optical access through the silica sample facilitates measurement of the longitudinal Ps energy, and the Ps energy in the reflection geometry is found to decrease with positron energy as expected, with a minimum achievable Ps energy of 0.203(12) and 0.26(3) eV for the transverse and longitudinal directions, respectively. In the transmission geometry cooling of Ps becomes evident at the minimum positron impact energy required for the positrons to penetrate the carbon foil and enter the meso-structured silica. The minimum energies for this geometry are 0.210(12) and 0.287(14) eV in the transverse and longitudinal directions, respectively, and the minimum achievable Ps energy is found to be limited by the thickness of the structured silica target, since the same energy was found in both geometries.
机译:已经使用单次正电子lifetime没寿命光谱和多普勒光谱对薄中观结构的二氧化硅靶的反射和透射中的正电子(Ps)能量和形成分数进行了测量。二氧化硅样品是使用蒸发的SiO2的掠射角沉积在悬浮的薄碳箔上制成的。通过二氧化硅样品的光学通道有助于测量纵向Ps能量,并且发现反射几何体中的Ps能量随正电子能量的降低而降低,对于Ps能量,可实现的最小Ps能量为0.203(12)和0.26(3)eV。横向和纵向。在传输几何结构中,Ps的冷却在正电子穿透碳箔并进入内消旋结构的二氧化硅所需的最小正电子冲击能下变得明显。这种几何形状的最小能量在横向和纵向分别为0.210(12)和0.287(14)eV,并且发现最小可实现的Ps能量受结构化二氧化硅靶材厚度的限制,因为相同的能量在两个几何中都被发现。

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