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Development of a solder bump technique for contacting a three-dimensional multi electrode array

机译:用于接触三维多电极阵列的焊料凸点技术的开发

摘要

The application of a solder bump technique for contacting a three-dimensional multi electrode array is presented. Solder bumping (or C4: Controlled Collapse Chip Connections, also called Flip Chip contacting) is the most suitable contacting technique available for small dimensions and large numbers of connections. Techniques adapted from the literature could successfully be scaled down to be used for 55x55 μm pads at 120 μm heart-to-heart spacing, yielding well-conducting, reasonably strong bonds.
机译:介绍了一种焊料凸点技术在接触三维多电极阵列中的应用。焊锡凸点(或C4:可控塌陷芯片连接,也称为倒装芯片接触)是最适用于小尺寸和大量连接的接触技术。从文献改编的技术可以成功地按比例缩小,以在心与心的间距为120μm的情况下用于55x55μm的焊盘,从而产生导电性强的键合。

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