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Characterization of MPS capped CdS quantum dots and formation of self-assembled quantum dots thin films on a glassy substrate

机译:盖有MPS的CdS量子点的表征以及在玻璃状基底上形成自组装量子点薄膜

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摘要

Colloidal, powdered and thin film forms of MPS capped CdS quantum dots have been produced by combination of colloidal chemistry and sol-gel method. Nanoparticles were self-assembled directly on a glass substrate using spin coating method without introducing any matrix. Colloidal, powdered and thin film forms were characterised by absorbance, photolimunescence, XRD, FT-IR, HRTEM and AFM measurements. The HRTEM images give a grain size of 2.5-3.0 nm and this is in agreement with the values found in the absorbance and XRD measurement. Average size of the quantum dots increase with increasing of heat treatment temperature due to Oswald ripening.
机译:通过胶体化学和溶胶-凝胶法相结合的方法,制备了MPS封端的CdS量子点的胶体,粉末和薄膜形式。使用旋涂法将纳米颗粒直接自组装在玻璃基板上,而无需引入任何基质。胶体,粉末和薄膜形式通过吸光度,光致发光,XRD,FT-IR,HRTEM和AFM测量来表征。 HRTEM图像的晶粒尺寸为2.5-3.0 nm,这与吸光度和XRD测量中的值一致。由于奥斯瓦尔德熟化,量子点的平均尺寸随着热处理温度的升高而增加。

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