首页> 外文OA文献 >A model for calculating impact ionization transition rate in wurtzite GaN for use in breakdown voltage simulation
【2h】

A model for calculating impact ionization transition rate in wurtzite GaN for use in breakdown voltage simulation

机译:用于击穿电压模拟的纤锌矿GaN中碰撞电离转变率的计算模型

代理获取
本网站仅为用户提供外文OA文献查询和代理获取服务,本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文,但由于OA文献来源多样且变更频繁,仍可能出现获取不到、文献不完整或与标题不符等情况,如果获取不到我们将提供退款服务。请知悉。

摘要

A model for calculating impact ionization transition rate (IITR) in wurtzite GaN has been developedfor use in breakdown voltage simulations. The characteristic feature of the model is to calculateenergy-dependent IITR by taking a conduction band index into account. Depending on the bandindex, the IITR values calculated by the proposed model show spreading by three orders ofmagnitude in the electron energy range from 6.5 to 8 eV, while this spreading is totally disregarded inthe conventional model. An impact ionization coefficient is calculated based on a full band MonteCarlo simulation which incorporates IITRs by the proposed model. The calculated impact ionizationcoefficients by the proposed model exhibit better agreements with those by the rigorous model.The proposed model is applied to the calculation of breakdown characteristics for AlGaN/GaNHEMTs and demonstrates a higher breakdown voltage by about 30% than that by the conventionalmodel.
机译:已开发出一种用于计算纤锌矿GaN中的碰撞电离转变速率(IITR)的模型,用于击穿电压仿真。该模型的特征是通过考虑导带指数来计算与能量有关的IITR。取决于能带指数,由所提出的模型计算出的IITR值显示出在6.5至8 eV的电子能量范围内扩展了三个数量级,而在传统模型中则完全忽略了这种扩展。基于全频带蒙特卡洛模拟计算碰撞电离系数,该模拟电离系数结合了所提出的模型的IITR。所提出的模型计算出的碰撞电离系数与严格模型显示出更好的一致性。所提出的模型用于计算AlGaN / GaN HEMT的击穿特性,并证明其击穿电压比传统模型高约30%。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
代理获取

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号