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A highly sensitive evaluation method for the determination of different current conduction mechanisms through dielectric layers

机译：一种高灵敏度的评估方法，用于通过介电层确定不同的电流传导机制

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Murakami, M.; Rommel, M.; Yanev, V.; Erlbacher, T.; Bauer, A.J.; Frey, L.;
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1. A highly sensitive evaluation method for the determination of different current conduction mechanisms through dielectric layers [J] . Katsuhisa Murakami, Mathias Rommel, Vasil Yanev, Journal of Applied Physics . 2011,第V110N5期

机译：用于确定通过介电层的不同电流传导机制的高度灵敏的评估方法
2. Limitations in the methods of determination of conduction mechanisms in high-permittivity dielectric nano-layers [J] . Novkovski N Physica, B. Condensed Matter . 2007,第1期

机译：高介电常数介电纳米层中导电机理的确定方法的局限性
3. Investigation of low-temperature electrical conduction mechanisms in highly resistive GaN bulk layers extracted with Simple Parallel Conduction Extraction Method [J] . A. Yildiz, S.B. Lisesivdin, M. Kasap, Applied Physics A: Materials Science & Processing . 2010,第3期

机译：简单平行导电萃取法萃取高电阻GaN体层中低温导电机理的研究
4. CORRELATION BETWEEN DEFECTS, LEAKAGE CURRENTS AND CONDUCTION MECHANISMS IN THIN HIGH-K DIELECTRIC LAYERS [C] . A. PASKALEVA, E. ATANASSOVA, M. LEMBERGER, NATO Advanced Research Workshop on Defects in Advanced High-k Dielectric Nano-Electronic Semiconductor Devices . 2006

机译：薄高k介电层中缺陷，泄漏电流和传导机制的相关性
5. The Effects of Processing Induced Damage on Electrical Conduction Mechanisms and Time-Dependent Dielectric Breakdown of Low-k Organosilicates. [D] . Nichols, Michael Thomas. 2013

机译：加工引起的损伤对低k有机硅酸盐的导电机理和时间依赖性介电击穿的影响。
6. Highly Sensitive Breathable and Flexible Pressure Sensor Based on Electrospun Membrane with Assistance of AgNW/TPU as Composite Dielectric Layer [O] . Jie Wang, Yaoyuan Lou, Bin Wang, 2020

机译：基于Extrom纺锤的高度敏感透气和柔性的压力传感器以及Agnw / TPU作为复合介电层的辅助
7. Investigation of low-temperature electrical conduction mechanisms in highly resistive GaN bulk layers extracted with Simple Parallel Conduction Extraction Method [O] . Yildiz, A., Lisesivdin, S.B., Kasap, M., 2010

机译：简单平行导电萃取法萃取高电阻GaN体层中低温导电机理的研究
8. DETERMINATION OF THE PROPERTIES OF DIELECTRIC LAYERS ON DIELECTRIC SUBSTRATES BY THE METHOD OF RADIO WAVE ELLIPSOMETRY [R] . SIEGFRIED AUER, JOHN SCHUIT 1975

机译：用无线电波法测定介电基板上介电层的性质

A highly sensitive evaluation method for the determination of different current conduction mechanisms through dielectric layers

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