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Characterizing the influence of neutron fields in causing single-event effects using portable detectors

机译:表征使用便携式探测器引起单粒子效应的中子场的影响

摘要

The malfunction of semiconductor devices caused by cosmic rays is known as Single Event Effects(SEEs). In the atmosphere, secondary neutrons are the dominant particles causing this effect. The neutron flux density in atmosphere is very low. For a good statistical certainty, millions of device hours are required to measure the event rate of a device in the natural environment. Event rates obtained in such testings are accurate. To reduce the cost and time of getting the event rate, a device is normally taken to artificial accelerated neutron beams to measure its sensitivity to neutrons. Comparing the flux density of the beam and the flux density of a location in the atmosphere, the real time event rate can be predicted by the event rate obtained. This testing method was standardized as the neutron accelerated soft error rate (ASER) testing in JEDEC JESD89A standard. However, several life testings indicated that the neutron flux density predictions given by the accelerated testings can have large errors. Up to a factor of 2 discrepancy was reported in the literature. One of the major error sources is the equivalence of the absolute neutron flux density in the atmosphere and in accelerated beam. This thesis proposes an alternative accelerated method of predicting the real-time neutron error rate by using proxy devices. This method can avoid the error introduced by the uncertainty in the neutron flux density. The Imaging Single Event Effect Monitor (ISEEM) is one of the proxy devices. It is the instrument originally developed by Z. Török and his co-workers in the University of Central Lancashire. A CCD was used as the sensitive element to detect neutrons. A large amount of data sets acquired by Török were used in this work. A re-engineered ISEEM has been developed in this work to improve ISEEM performance in life testings. Theoretical models have been developed to analyze the response of ISEEM in a wide range of neutron facilities and natural environment. The agreement of the measured and calculated cross-sections are within the error quoted by facilities. Because of the alpha contamination and primary proton direct ionization effects, performance of ISEEM in life testings appeared to be weak.
机译:由宇宙射线引起的半导体器件故障被称为单事件效应(SEE)。在大气中,次级中子是引起这种效应的主要粒子。大气中的中子通量密度非常低。为了获得良好的统计确定性,需要数百万个设备小时来测量自然环境中设备的事件发生率。在此类测试中获得的事件发生率是准确的。为了降低获得事件发生率的成本和时间,通常将设备用于人工加速中子束以测量其对中子的敏感性。将光束的通量密度与大气中某个位置的通量密度进行比较,可以通过获得的事件发生率来预测实时事件发生率。该测试方法被标准化为JEDEC JESD89A标准中的中子加速软错误率(ASER)测试。但是,一些寿命测试表明,加速测试给出的中子通量密度预测可能会有很大的误差。文献报道最多有2个差异。主要误差源之一是大气和加速束中的绝对中子通量密度的等价物。本文提出了一种通过使用代理设备来预测实时中子错误率的替代加速方法。这种方法可以避免中子通量密度不确定性带来的误差。成像单事件效果监视器(ISEEM)是代理设备之一。它最初是由Z.Török和他的同事在中央兰开夏大学开发的。 CCD被用作检测中子的敏感元素。这项工作使用了Török获取的大量数据集。在这项工作中开发了重新设计的ISEEM,以提高ISEEM在寿命测试中的性能。已经开发了理论模型来分析ISEEM在各种中子设施和自然环境中的响应。测量横截面和计算横截面的一致性在设备引用的误差范围内。由于存在α污染和主要的质子直接电离效应,ISEEM在寿命测试中的性能似乎很弱。

著录项

  • 作者

    Cai Xiao Xiao;

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  • 年度 2010
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  • 原文格式 PDF
  • 正文语种 English
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