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On the development of a far-infrared bolometric detector using a 2DEG as the absorbing medium

机译:关于使用2DEG作为吸收介质的远红外辐射热检测器的开发

摘要

This thesis describes the development of a far-infrared bolometric detector using a two-dimensional electron gas (2DEG) as the detecting medium. The 2DEG is formed at a AlGaAs/GaAs heterojunction made of layers of undoped GaAs and AlGaAs and highly doped (5 x lO126 3) AlGaAs. A 2DEG layer grown in this way in a molecular beam epitaxy (MBE) system is generally within 100 nm of the surface of the wafer and is subsequently patterned by etching away the surrounding wafer material and leaving a mesa containing the buried 2DEG. Ohmic contact to the 2DEG is achieved either through a diffusion of charge carriers into the contact region. Using a 2DEG as the absorbing medium in bolometers will yield detectors that are fast, sensitive, and frequency selective. The low electron densities in 2DEGs (1011 cm) allow large-area devices with extremely low thermal conductance between the electrons and the semiconductor lattice (e.g. Appleyard, et al. 1). The fast time constant (on the order of 1 ps) of the electron relaxation time in the 2DEG would allow for very high bandwidth spectroscopy. This thesis presents an overview of the use of 2DEG bolometers and a detailed study of their properties relevant for use as THz HEBs or CEBs. Chapter 1 briefly outlines the importance of Terahertz astronomy. Chapter 2 presents an introduction to bolometer theory. Chapter 3 provides a description of the electrical, thermal, and magnetic properties of 2DEGs. Chapter 4 outlines the equations governing the operation of 2DEG HEBs and CEBs and contains computer-simulated data. Chapter 5 describes our device fabrication, testing methods, and gives the results of our measurements. Finally, this thesis concludes with a discussion of the results of the tests and possible interpretations in terms of different physical models for electron-photon interactions in the 2DEG.
机译:本文描述了一种以二维电子气(2DEG)作为检测介质的远红外辐射热检测器的研制。 2DEG在AlGaAs / GaAs异质结处形成,该异质结由未掺杂的GaAs和AlGaAs以及高掺杂的(5 x 10126 3)AlGaAs层组成。以这种方式在分子束外延(MBE)系统中生长的2DEG层通常位于晶片表面100 nm以内,随后通过蚀刻掉周围的晶片材料并留下包含掩埋的2DEG的台面来进行图案化。通过将电荷载流子扩散到接触区域中,可以实现与2DEG的欧姆接触。在辐射热计中使用2DEG作为吸收介质将产生快速,灵敏和频率选择性的检测器。 2DEG(1011 cm)中的低电子密度使大面积的器件在电子与半导体晶格之间具有极低的热导率(例如Appleyard等人1)。 2DEG中电子弛豫时间的快速时间常数(约为1 ps)将允许非常高的带宽光谱。本文概述了2DEG辐射热测量计的使用,并详细研究了与用作THz HEB或CEB的性能有关的特性。第1章简要概述了太赫兹天文学的重要性。第2章介绍了辐射热计理论。第3章介绍了2DEG的电,热和磁性能。第4章概述了控制2DEG HEB和CEB操作的方程式,并包含计算机模拟的数据。第5章介绍了我们的设备制造,测试方法,并给出了测量结果。最后,本文以2DEG中电子-光子相互作用的不同物理模型对测试结果和可能的解释进行了讨论。

著录项

  • 作者

    Bacchus Ian Dean;

  • 作者单位
  • 年度 2008
  • 总页数
  • 原文格式 PDF
  • 正文语种 English
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