首页> 外文OA文献 >Growth and characterisation of dilute nitride antimonide layers by plasma-assisted molecular beam epitaxy
【2h】

Growth and characterisation of dilute nitride antimonide layers by plasma-assisted molecular beam epitaxy

机译:等离子体辅助分子束外延生长和表征稀释氮化锑层

摘要

The work presented in this thesis is concerned with the growth and characterisation of III-NSb films by plasma-assisted molecular beam epitaxy (PA-MBE). The research was motivated by their application in technologically important regions of the IR spectrum. Homoepitaxial growth of GaSb films was conducted and characterised as a function of V:III ratio and growth temperature, permitting observation of morphology changes with growth conditions, also providing insight into surfaces of the ternary dilute nitride. Heteroepitaxial GaSb/GaAs growth has highlighted defect formation and propagation arising from lattice mismatched deposition. Films of GaNxSb1-x, a material of interest for device applications in the 2-5 μm spectral range, have been grown on GaSb(001) substrates. The results demonstrate the degree to which substitutional N content may be controlled through variation of the temperature and rate of deposition. Models based upon kinetic and thermodynamic principles and previously applied to GaNxAs1-x have been evaluated for N content of GaNxSb1-x films as a function of the rate and temperature used for growth. The growth of InNxSb1-x, an alloy of significance in the technologically important wavelength region of 8-12 μm, upon InSb(001) substrates is described. There is qualitative agreement with the temperature dependence of N content. Analysis of the substitutional N content as a function of growth rate, however, suggests a difference between GaNxSb1-x and GaNxAs1-x. An explanation is presented for the trend in the level of substitutional N uptake across III-V-N materials. Further experiments are proposed to extend the parameter space sampled in the investigation of GaNxSb1-x and InNxSb1-x films, with regard to the Sb:III ratio employed during growth. Initial results are reported from measurements undertaken with a pyrometer operating at 1.6 μm, suggesting that growth can be conducted at lower temperatures. Additional preliminary results are presented for the growth of GaxIn1-xNySb1-y films, demonstrating a tuneable band gap quaternary material, lattice matched to GaSb is possible.
机译:本文的研究工作涉及等离子体辅助分子束外延(PA-MBE)技术对III-NSb薄膜的生长和表征。这项研究是由于它们在红外光谱的技术重要区域中的应用而引起的。进行了GaSb薄膜的同质外延生长,并将其表征为V:III比和生长温度的函数,从而可以观察随生长条件而发生的形态变化,还可以洞察三元稀氮化物的表面。异质外延GaSb / GaAs的生长突出了由晶格失配沉积引起的缺陷形成和扩散。 GaNxSb1-x膜是在2-5μm光谱范围内用于设备应用的材料,已在GaSb(001)衬底上生长。结果表明,可以通过改变温度和沉积速率来控制取代氮含量的程度。已经评估了基于动力学和热力学原理并先前应用于GaNxAs1-x的模型的GaNxSb1-x膜中N含量随生长速率和温度的变化。描述了在InSb(001)衬底上InNxSb1-x的生长,InNxSb1-x是在8-12μm的重要技术波长范围内具有重要意义的合金。 N含量对温度的依赖性在质量上是一致的。然而,分析替代N含量随生长速率的变化,表明GaNxSb1-x和GaNxAs1-x之间存在差异。提出了关于跨III-V-N材料的替代氮吸收水平趋势的解释。关于生长过程中使用的Sb:III比,提出了进一步的实验以扩展GaNxSb1-x和InNxSb1-x膜研究中采样的参数空间。据报道,使用在1.6μm的高温计进行的测量获得了初步结果,这表明可以在较低的温度下进行生长。提出了GaxIn1-xNySb1-y薄膜生长的其他初步结果,表明可调谐的带隙四元材料可以与GaSb晶格匹配。

著录项

  • 作者

    Bomphrey J J;

  • 作者单位
  • 年度 2011
  • 总页数
  • 原文格式 PDF
  • 正文语种 English
  • 中图分类

相似文献

  • 外文文献
  • 中文文献
  • 专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号