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Magneto-optic and optical characterization of Tb/Co compositionally modulated amorphous films

机译:Tb / Co成分调制非晶薄膜的磁光和光学表征

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摘要

Amorphous Tb/Co compositionally modulated films were deposited on Si substrates with different modulation layer thicknesses ranging from about 2.5 to 15 Å. The nominal Tb to Co layer thickness ratios were systematically varied and the complex refractive index (n and k) and polar magneto-optical Kerr effects (rotation and ellipticity) were measured in the 3000–8000-Å spectral range as well. The samples were divided into two groups. In one group, the thickness of the Co layers was fixed, the Tb layer thickness varied. In the second group, the thickness of the Tb layer was fixed, and that of the Co layer thickness varied. The Kerr rotation and the coercivities of the samples showed very consistent and interesting changes. X-ray diffraction and x-ray fluorescence were also performed on the samples, which revealed layered structures, or compositional modulation, and provided information on the Tb to Co atomic ratios in the samples. Journal of Applied Physics is copyrighted by The American Institute of Physics.
机译:非晶态的Tb / Co成分调制膜沉积在Si基板上,其调制层的厚度范围大约为2.5至15。名义上的Tb与Co层的厚度比也有系统地变化,并且还在3000-8000-Å光谱范围内测量了复折射率(n和k)和极性磁光Kerr效应(旋转和椭圆率)。样品分为两组。一组中,Co层的厚度是固定的,Tb层的厚度是变化的。在第二组中,Tb层的厚度是固定的,而Co层的厚度是变化的。样品的克尔旋转和矫顽力显示出非常一致且有趣的变化。还对样品进行了X射线衍射和X射线荧光分析,揭示了层状结构或成分调制,并提供了有关样品中Tb与Co原子比的信息。 《应用物理杂志》的版权归美国物理学会所有。

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