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Small sample properties of CIPS panel unit root test under conditional and unconditional heteroscedasticity

机译:在条件和无条件异方差下CIps面板单位根检验的小样本性质

摘要

This paper used Monte Carlo simulations to analyze the small sample properties of cross-sectionally augmented panel unit root test (CIPS test). We considered situations involving two types of time-series heteroskedasticity (unconditional and ARCH) in the unobserved common factor and idiosyncratic error term. We found that the CIPS test could be extremely robust versus the two types of heteroskedasticity in the unobserved common factor. However, we found under-size distortion in the case of unconditional heteroskedasticity in the idiosyncratic error term, and conversely, over-size distortion in the case of ARCH. Furthermore, we observed a tendency for its over-size distortion to moderate with low volatility persistence in the ARCH process and exaggerate with high volatility persistence.
机译:本文使用蒙特卡洛模拟来分析横截面增强面板单位根测试(CIPS测试)的小样本属性。我们考虑了在未观察到的公因子和特异误差项中涉及两种时间序列异方差性(无条件和ARCH)的情况。我们发现,在未观察到的公因子中,CIPS测试相对于两种类型的异方差具有极强的鲁棒性。但是,我们发现在特质误差项中无条件的异方差情况下尺寸偏小,而在ARCH情况下则尺寸偏大。此外,我们发现在ARCH过程中,其超大幅度失真趋于适度且波动性持久性较低,而波动性持久性则过高。

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