首页> 外文OA文献 >Fork-Coupled Resonators for High Frequency Characterization of Dielectric Substrate Materials
【2h】

Fork-Coupled Resonators for High Frequency Characterization of Dielectric Substrate Materials

机译:用于介电基板材料高频特性的叉耦合谐振器

摘要

Abstract—Efficient coupling of energy in and out of a resonator can significantly enhance its performance, particularly when used for dielectric characterization of materials. In this paper, a new microstrip resonator is introduced, which uses fork-shaped feed elements for improving the coupling efficiency. The proposed resonator is studied both experimentally and theoretically with field simulation software. An important advantage of the fork microstrip resonator is attributed to its single-layer geometry and easier manufacturing processes. This resonator is used to characterize three different dielectric materials. Comparison of measurement results from the fork resonator with those obtained with a stripline resonator suggests that the proposed resonator offers a superior performance.
机译:摘要—谐振器内外能量的有效耦合可以显着提高其性能,尤其是在用于材料的介电特性分析时。本文介绍了一种新型的微带谐振器,它使用叉形馈电元件来提高耦合效率。利用现场仿真软件对提出的谐振器进行了实验和理论研究。叉形微带谐振器的一个重要优点归因于其单层几何形状和更容易的制造工艺。该谐振器用于表征三种不同的介电材料。将叉形谐振器的测量结果与带状线谐振器的测量结果进行比较表明,所提出的谐振器具有出色的性能。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号