QUANTITATIVE-DETERMINATION OF PHASES OF X-RAY REFLECTIONS FROM 3-BEAM DIFFRACTIONS .2. EXPERIMENTS FOR PERFECT CRYSTALS

摘要

[[abstract]]The method proposed by Chang & Tang [Acta Cryst. (1988). A44, 1065-1072] of quantitative determination of X-ray reflection phases from multiple diffraction profiles is applied to nearly perfect crystals of gallium arsenide. The detailed intensity-profile-analysis procedures are given. Multiple diffraction profiles obtained with a conventional X-ray source and synchrotron radiation are subjected to this analysis. It is found that, for this particular diffraction example, errors as small as 15° in phase determination are achieved. Errors due to the theoretical approximation, peak position measurement and scaling factor are also discussed.