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Semi-polar (11-22) AlGaN on overgrown GaN on micro-rod templates: Simultaneous management of crystal quality improvement and cracking issue

机译:微棒模板上过度生长的GaN上的半极性(11-22)alGaN:同时管理晶体质量改善和开裂问题

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摘要

© 2017 Author(s).Thick and crack-free semi-polar (11-22) AlGaN layers with various high Al compositions have been achieved by means of growth on the top of nearly but not yet fully coalesced GaN overgrown on micro-rod templates. The range of the Al composition of up to 55.7% was achieved, corresponding to an emission wavelength of up to 270 nm characterised by photoluminescence at room temperature. X-ray diffraction (XRD) measurements show greatly improved crystal quality as a result of lateral overgrowth compared to the AlGaN counterparts on standard planar substrates. The full width at half maximums of the XRD rocking curves measured along the [1-100]/[11-2-3] directions (the two typical orientations for characterizing the crystal quality of (11-22) AlGaN) are 0.2923°/0.2006° for 37.8% Al and 0.3825°/0.2064° for 55.7% Al, respectively, which have never been achieved previously. Our calculation based on reciprocal space mapping measurements has demonstrated significant strain relaxation in the AlGaN as a result of utilising the non-coalesced GaN underneath, contributing to the elimination of any cracks. The results presented have demonstrated that our overgrowth technique can effectively manage strain and improve crystal quality simultaneously.
机译:©2017作者。通过在微棒上过度生长的几乎但尚未完全聚结的GaN顶部生长,获得了具有各种高Al成分的厚且无裂纹的半极性(11-22)AlGaN层模板。 Al组成的范围达到了高达55.7%,对应于在室温下以光致发光为特征的高达270nm的发射波长。与标准平面基板上的AlGaN相比,X射线衍射(XRD)测量显示出由于横向过度生长而大大提高了晶体质量。沿[1-100] / [11-2-3]方向(用于表征(11-22)AlGaN晶体质量的两个典型取向)测得的XRD摇摆曲线的半峰全宽为0.2923°/对于37.8%的Al为0.2006°,对于55.7%的Al为0.3825°/ 0.2064°,这是以前从未达到的。我们基于对等空间映射测量的计算表明,由于利用了下方的非凸凹GaN,AlGaN中的应变明显松弛,有助于消除任何裂纹。给出的结果表明,我们的过度生长技术可以有效地管理应变并同时提高晶体质量。

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