首页> 外文OA文献 >Composition and Temperature Dependence of Structure and Piezoelectricity in (1−x)(K1−yNay)NbO3-x(Bi1/2Na1/2)ZrO3 Lead-Free Ceramics
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Composition and Temperature Dependence of Structure and Piezoelectricity in (1−x)(K1−yNay)NbO3-x(Bi1/2Na1/2)ZrO3 Lead-Free Ceramics

机译:(1-x)(K1-yNay)NbO3-x(Bi1 / 2Na1 / 2)ZrO3无铅陶瓷的组成和温度对结构和压电性的依赖性

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摘要

Lead-free piezoceramics with the composition (1−x)(K1−yNay)NbO3-x(Bi1/2Na1/2)ZrO3 (KNyN-xBNZ) were prepared using a conventional solid-state route. X-ray diffraction, Raman spectroscopy, and dielectric measurements as a function of temperature indicated the coexistence of rhombohedral (R) and tetragonal (T) phase, typical of a morphotropic phase boundary (MPB) as the BNZ concentration increased and by adjusting the K/Na ratio. High remnant polarization (Pr = 24 μC/cm2), piezoelectric coefficient (d33 = 320 pC/N), effective piezocoefficient (d*33 = 420 pm/V), coupling coefficient (kp = 48%), and high strain (S = 0.168%) were obtained at room temperature, but significant deterioration of Pr, d*33, and kp were observed by increasing from room temperature to 160°C (17.5 μC/cm2, 338 pm/V, and 32%, respectively) associated with a transition to a purely T phase. Despite these compositions showing promise for room-temperature applications, the deterioration in properties as a function of increasing temperature poses challenges for device design and remains to be resolved.
机译:使用常规固态路线制备具有(1-x)(K1-yNay)NbO3-x(Bi1 / 2Na1 / 2)ZrO3(KNyN-xBNZ)的无铅压电陶瓷。 X射线衍射,拉曼光谱和介电常数随温度的变化表明菱形(R)和四方(T)相共存,这是随着BNZ浓度的增加和通过调节K而形成的相变边界(MPB)。 / Na比。高残留极化(Pr = 24μC/ cm2),压电系数(d33 = 320 pC / N),有效压电系数(d * 33 = 420 pm / V),耦合系数(kp = 48%)和高应变(S =达到0.168%),但是从室温升高到160°C(分别为17.5μC/ cm2、338 pm / V和32%)时,Pr,d * 33和kp显着下降。与过渡到纯T相相关。尽管这些组合物显示出在室温下的应用前景,但是随着温度升高,性能下降对器件设计提出了挑战,并且有待解决。

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