Complex permittivity measurements at Ka-Band using rectangular dielectric waveguide

摘要

The rectangular dielectric waveguide (RDWG) techniqueudhas been developed for the determination of the dielectricudconstant of materials from effective refractive index measurements in the Q andWbands. This paper describes the use of an optimization method in conjunction with the RDWG technique for the determination of both the dielectric constant and loss tangent of materials at Ka-Band. The effect of the uncertainty in the measuredudsample thickness is presented.