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Direct measurement of the near-field super resolved focused spot in InSb

机译:直接测量InSb中的近场超分辨聚焦点

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摘要

Under appropriate laser exposure, a thin film of InSb exhibits a sub-wavelength thermally modified area that can be used to focus light beyond the diffraction limit. This technique, called Super-Resolution Near-Field Structure, is a potential candidate for ultrahigh density optical data storage and many other high-resolution applications. We combined near field microscopy, confocal microscopy and time resolved pump-probe technique to directly measure the induced sub-diffraction limited spot in the near-field regime. The measured spot size was found to be dependent on the laser power and a decrease of 25% (100nm) was observed. Experimental evidences that support a threshold-like simulation model to describe the effect are also provided. The experimental data are in excellent agreement with rigorous simulations obtained with a three dimensional Finite Element Method code.
机译:在适当的激光照射下,InSb薄膜会显示一个亚波长的热改性区域,可用于聚焦超出衍射极限的光。这种技术称为超分辨率近场结构,是超高密度光学数据存储和许多其他高分辨率应用的潜在候选者。我们结合了近场显微镜,共聚焦显微镜和时间分辨泵浦探针技术来直接测量近场条件下的诱导亚衍射极限光斑。发现测得的光斑大小取决于激光功率,观察到减小了25%(100nm)。还提供了支持类似阈值的仿真模型来描述效果的实验证据。实验数据与使用三维有限元方法代码进行的严格模拟非常吻合。

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