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New pathways for improved quantification of energy-dispersive X-ray spectra of semiconductors with multiple X-ray lines from thin foils investigated in transmission electron microscopy

机译：利用透射电子显微镜研究薄箔多个X射线的半导体能量色散X射线光谱量化的新途径

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Parri M.C.; Qiu Y.; Walther T.;
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年度 2015
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1. New pathways for improved quantification of energy-dispersive X-ray spectra of semiconductors with multiple X-ray lines from thin foils investigated in transmission electron microscopy [J] . Parri M. C., Qiu Y., Walther T. Journal of Microscopy . 2015,第3期

机译：在透射电子显微镜中研究改善具有薄箔的多条X射线线的半导体的能量色散X射线谱的定量化的新途径
2. Improving Signal-to-Noise Ratio in Scanning Transmission Electron Microscopy Energy-Dispersive X-Ray (STEM-EDX) Spectrum Images Using Single-Atomic-Column Cross-Correlation Averaging [J] . Jeong Jong Seok, Mkhoyan K. Andre Microscopy and microanalysis: The official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada . 2016,第3期

机译：使用单原子列互相关平均来提高扫描透射电子显微镜能量色散X射线（STEM-EDX）光谱图像中的信噪比
3. Synchrotron white beam X-ray topography, transmission electron microscopy and high-resolution X-ray diffraction studies of defects and strain relaxation processes in wide band gap semiconductor crystals and thin films [J] . Dudley M, Bai J, Huang X, Materials science in semiconductor processing . 2006,第1a3期

机译：同步带隙白光X射线形貌，透射电子显微镜和高分辨率X射线衍射研究宽带隙半导体晶体和薄膜中的缺陷和应变松弛过程
4. Calibration of thickness-dependent k-factors for germanium X-ray lines to improve energy-dispersive X-ray spectroscopy of SiGe layers in analytical transmission electron microscopy [C] . Y Qiu, VH Nguyen, A Dobbie, Microscopy of Semiconducting Materials Conference . 2013

机译：用于锗X射线线的厚度依赖性K因子的校准，以改善分析透射电子显微镜中SiGe层的能量分散X射线光谱
5. Insights from scanning transmission electron microscopy and x-ray diffraction into the structure and composition of non-crystalline thin solid films [D] . Mitchson, Gavin Andersen. 2016

机译：从扫描透射电子显微镜和X射线衍射到非晶薄固体膜的结构和组合物中的见解
6. Soft x-ray reflectometry hard x-ray photoelectron spectroscopy and transmission electron microscopy investigations of the internal structure of TiO2(Ti)/SiO2/Si stacks [O] . Elena O Filatova, Igor V Kozhevnikov, Andrey A Sokolov, 2012

机译：TiO2（Ti）/ SiO2 / Si叠层内部结构的软X射线反射法硬X射线光电子能谱和透射电子显微镜研究
7. New pathways for improved quantification of energy-dispersive X-ray spectra of semiconductors with multiple X-ray lines from thin foils investigated in transmission electron microscopy [O] . M.C. PARRI, Y. QIU, T. WALTHER 2015

机译：具有从研究中的透射电子显微镜中研究的薄箔的多个X射线线的半导体能量分散X射线光谱的新途径
8. Calorimetric Transmission Measurements through Thin Carbon Foils for Spectral Characterization of X-Ray Energies below 2 keV [R] . Craven, W. M., Burns, W. C. 1973

机译：通过薄碳箔进行量热透射测量，用于低于2 keV的X射线能量的光谱表征

New pathways for improved quantification of energy-dispersive X-ray spectra of semiconductors with multiple X-ray lines from thin foils investigated in transmission electron microscopy

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