Linking Mixed-Signal Design and Test: Generation and Evaluation of Specification-Based Tests

摘要

The work described in this thesis is aimed at the exploration of new methodsudfor the integration of design and test development procedures for mixedsignaludintegrated circuits (IC's). Mixed-signal IC's are currently found inudmany electronic systems, including telecommunications, audio and videoudinstruments, automotive parts, etc. The testing of these IC's presentsudproblems due to the complex nature of analog functionality and the nonautomatedudanalog design process. Automatic generation of test programsudfor analog parts is a problem which is not yet fully solved. Once a test isudgenerated, formal methods to ensure the quality of developed tests do notudexist or have a large overhead. Systematic links between design and testuddevelopment processes of analog and mixed-signal circuits are required toudimprove these points and to ensure high quality and low time-to-marketud(TTM) for mixed-signal IC's.