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Low carrier concentration crystals of the topological insulator Bi2-xSbxTe3-ySey: a magnetotransport study

机译:拓扑绝缘体Bi2-xsbxTe3-yses的低载流子浓度晶体:磁转运研究

摘要

In 3D topological insulators achieving a genuine bulk-insulating state is an important research topic. Recently, the material system (Bi,Sb)2(Te,Se)3 (BSTS) has been proposed as a topological insulator with high resistivity and a low carrier concentration (Ren et al 2011 Phys. Rev. B 84 165311). Here we present a study to further refine the bulk-insulating properties of BSTS. We have synthesized BSTS single crystals with compositions around x = 0.5 and y = 1.3. Resistance and Hall effect measurements show high resistivity and record low bulk carrier density for the composition Bi$_{1.46}$Sb$_{0.54}$Te$_{1.7}$Se$_{1.3}$. The analysis of the resistance measured for crystals with different thicknesses within a parallel resistor model shows that the surface contribution to the electrical transport amounts to 97% when the sample thickness is reduced to 1 μm. The magnetoconductance of exfoliated BSTS nanoflakes shows 2D weak antilocalization with $lpha simeq -1$ as expected for transport dominated by topological surface states.
机译:在3D拓扑绝缘子中,达到真正的本体绝缘状态是重要的研究课题。近来,已经提出材料系统(Bi,Sb)2(Te,Se)3(BSTS)作为具有高电阻率和低载流子浓度的拓扑绝缘体(Ren等人2011 Phys.Rev.B 84 165311)。在这里,我们提出一项研究,以进一步完善BSTS的整体绝缘性能。我们合成了BSTS单晶,其成分约为x = 0.5和y = 1.3。电阻和霍尔效应测量结果显示,组成Bi $ _ {1.46} $ Sb $ _ {0.54} $ Te $ _ {1.7} $ Se $ _ {{1.3} $}具有较高的电阻率和较低的体载流子密度。在并联电阻器模型中对具有不同厚度的晶体测量的电阻的分析表明,当样品厚度减小到1μm时,表面对电传输的贡献达到97%。脱落的BSTS纳米薄片的磁导显示二维微弱的局部化,如预期由拓扑表面状态主导的传输所具有的$ alpha simeq -1 $。

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