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Cross-bidge Kelvin resistor (CBKR) structures for measurement of low contact resistances

机译：用于测量低接触电阻的交叉电阻开尔文电阻（CBKR）结构

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Stavitski N.; Klootwijk J.H.; Zeijl H.W. van; Boksteen B.K.; Kovalgin A.Y.; Wolters R.A.M.;
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年度 2007
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正文语种 {"code":"en","name":"English","id":9}
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1. Cross-Bridge Kelvin Resistor Structures for Reliable Measurement of Low Contact Resistances and Contact Interface Characterization [J] . Stavitski N., Klootwijk J. H., van Zeijl H. W., IEEE Transactions on Semiconductor Manufacturing . 2009,第1期

机译：跨桥开尔文电阻器结构，用于低接触电阻的可靠测量和接触界面特性
2. The spreading resistance error in the vertical Kelvin test resistor structure for the specific contact resistivity [J] . Lee C.L., Yang W.L. IEEE Transactions on Electron Devices . 1988,第4期

机译：对于特定的接触电阻率，垂直开尔文测试电阻器结构中的扩展电阻误差
3. The effect of sheet resistance modifications underneath the contact on the extraction of the contact resistivity: application to the cross Kelvin resistor [J] . Scorzoni A., Finetti M. IEEE Transactions on Electron Devices . 1988,第3期

机译：接触下面薄层电阻的改变对接触电阻率提取的影响：应用于交叉开尔文电阻器
4. A Study of Cross-Bridge Kelvin Resistor Structures for Reliable Measurement of Low Contact Resistances [C] . N. Stavitski, J. H. Klootwijk, H. W. van Zeijl, International Conference on Microelectronic Test Structures . 2007

机译：用于低接触电阻可靠测量的跨桥开尔韦突电阻结构研究
5. Kelvin probe electrode for contactless potential measurement on concrete-properties and applications [D] . Walsh, Michael T. 2013

机译：开尔文探针电极，用于非接触式电势测量，用于混凝土性能和应用
6. Calibration of Germanium Resistors at Low Temperatures (2–20° Kelvin) [O] . G. Cataland, H. H. Plumb 1966

机译：低温（2–20°开氏温度）下锗电阻的校准
7. Cross-Bridge Kelvin Resistor Structures for Reliable Measurement of Low Contact Resistances and Contact Interface Characterization [O] . Natalie Stavitski, Student Member, Johan H. Klootwijk, 2014

机译：跨桥开尔文电阻器结构，可靠地测量低接触电阻和接触界面特性
8. Specific Contact Resistance Extraction from Four-Point-Probe Measurements onMultilayered Film Structures [R] . Vu, Q. T., Kolawa, E., Halperin, L., 1991

机译：多层薄膜结构四点探针测量的特定接触电阻提取

Cross-bidge Kelvin resistor (CBKR) structures for measurement of low contact resistances

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