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Interstrand contact resistance and AC loss of a 48-strands Nb3Sn CIC conductor with a Cr/Cr-oxide coating

机译:具有Cr / Cr氧化物涂层的48股Nb3sn CIC导体的Interstrand接触电阻和aC损耗

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摘要

The interstrand contact resistance (Rc) between crossing strands in Cable-In-Conduit Conductors (CICC's) determines the coupling loss and the stability against local disturbances. The surface oxidation, surface roughness and micro-scale sliding of the contact surfaces are key parameters in the Rc. The level of surface oxidation is influenced by manufacturing parameters in the strand and cable production, the plating procedure determining the crystalline structure and by the heat treatment. A new process of making a more stable oxide has been developed and characterised. The Cr coating is actually build up out of two different layers. The first layer is a hard Cr coating, identical to the standard Cr layer previously used. On top of this a layer of blade Cr oxide is deposited electrolytically. The coupling loss time constant and Rc are measured on a 48-strands CIC Conductor with this double-coated strand material. The void fraction amounts to 36% and the strand, cabling and jacketing are identical to those used in the previous chrome vendor comparison action. The results, presented in terms of Rc, time constant n¿, and the atomic concentration of oxygen (acO) in the peripheral region of the strand, are compared to previous results from single coated strands
机译:导线管导体(CICC's)中交叉股之间的股间接触电阻(Rc)确定耦合损耗和抵抗局部干扰的稳定性。接触表面的表面氧化,表面粗糙度和微尺度滑动是Rc中的关键参数。表面氧化水平受绞线和电缆生产中的制造参数,确定晶体结构的电镀程序以及热处理的影响。已经开发并表征了制备更稳定的氧化物的新工艺。 Cr涂层实际上是由两个不同的层组成的。第一层是硬铬涂层,与先前使用的标准铬层相同。在其上电解沉积一层氧化铬叶片。耦合损耗时间常数和Rc是在48股CIC导体上用这种双涂层绞线材料测量的。空隙率总计为36%,并且绞线,电缆和护套与先前的镀铬供应商比较操作中使用的相同。将结果以Rc,时间常数n?和线材外围区域中的氧原子浓度(acO)表示,与先前单条包覆线材的结果进行了比较

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