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Combination of x-ray diffraction and electron microscopy for real structure investigations on luminescent oxonitridosilicates, nitridogallates and other nitride compounds

机译：X射线衍射和电子显微镜相结合，用于发光氧氮化硅酸盐，氮化物硅酸盐和其他氮化物的真实结构研究

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Seibald Markus Armin;
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2. Structural investigation of nitrided c-sapphire substrate by grazing incidence x-ray diffraction and transmission electron microscopy [J] . Hyo-Jong Lee, Jun-Seok Ha, S. W. Lee, Applied Physics Letters . 2007,第20期

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4. Investigation on microstructure-magnetic property relationship of nanocrystalline Fe-Zr-B-Ag magnetic films using high resolution transmission electron microscopy and X-ray diffraction [C] . W. J. Lee, B. K. Min, J. S. Song, IEEE International Magnetics Conference . 2005

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Combination of x-ray diffraction and electron microscopy for real structure investigations on luminescent oxonitridosilicates, nitridogallates and other nitride compounds

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