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Extended Nijboer–Zernike approach to aberration and birefringence retrieval in a high-numerical-aperture optical system

机译:Nijboer-Zernike扩展方法在高数值孔径光学系统中进行像差和双折射的获取

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摘要

The judgment of the imaging quality of an optical system can be carried out by examining its through-focus intensity distribution. It has been shown in a previous paper that a scalar-wave analysis of the imaging process according to the extended Nijboer–Zernike theory allows the retrieval of the complex pupil function of the imaging system, including aberrations as well as transmission variations. However, the applicability of the scalar analysis is limited to systems with a numerical aperture (NA) value of the order of 0.60 or less; beyond these values polarization effects become significant. In this scalar retrieval method, the complex pupil function is represented by means of the coefficients of its expansion in a series involving the Zernike polynomials. This representation is highly efficient, in terms of number and magnitude of the required coefficients, and lends itself quite well to matching procedures in the focal region. This distinguishes the method from the retrieval schemes in the literature, which are normally not based on Zernike-type expansions, and rather rely on pointby-point matching procedures. In a previous paper [J. Opt. Soc. Am. A 20, 2281 (2003)] we have incorporated the extended Nijboer–Zernike approach into the Ignatowsky–Richards/Wolf formalism for the vectorial treatment of optical systems with high NA. In the present paper we further develop this approach by defining an appropriate set of functions that describe the energy density distribution in the focal region. Using this more refined analysis, we establish the set of equations that allow the retrieval of aberrations and birefringence from the intensity point-spread function in the focal volume for high-NA systems. It is shown that one needs four analyses of the intensity distribution in the image volume with different states of polarization in the entrance pupil. Only in this way will it be possible to retrieve the “vectorial” pupil function that includes the effects of birefringence induced by the imaging system. A first numerical test example is presented that illustrates the importance of using the vectorial approach and the correct NA value in the aberration retrieval scheme.
机译:光学系统成像质量的判断可以通过检查其透焦强度分布来进行。在先前的论文中已经表明,根据扩展的Nijboer-Zernike理论对成像过程进行标量波分析,可以检索成像系统的复杂光瞳功能,包括像差和透射率变化。但是,标量分析的适用性仅限于数值孔径(NA)值为0.60或更小的系统。超出这些值,极化效应变得很明显。在这种标量检索方法中,复瞳孔函数通过其展开系数在涉及Zernike多项式的级数中表示。就所需系数的数量和大小而言,这种表示非常高效,并且非常适合于焦点区域中的匹配过程。这使该方法与文献中的检索方案区别开来,后者通常不基于Zernike型展开,而是依靠逐点匹配过程。在上一篇论文中[J.选择。 Soc。上午。 20,2281(2003)],我们将扩展的Nijboer-Zernike方法合并到Ignatowsky-Richards / Wolf形式主义中,以对具有高NA的光学系统进行矢量处理。在本文中,我们通过定义一组描述焦点区域能量密度分布的函数来进一步发展这种方法。使用这种更精细的分析,我们建立了方程组,允许从高NA系统的焦距中的强度点扩散函数中检索像差和双折射。结果表明,需要对入射光瞳中不同偏振态的图像体积中的强度分布进行四项分析。只有这样,才有可能获得“矢量”光瞳函数,其中包括由成像系统引起的双折射效应。提出了第一个数字测试示例,该示例说明了在像差检索方案中使用矢量方法和正确的NA值的重要性。

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