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Bypassing the Combinatorial Explosion: Using Similarity to Generate and Prioritize T-wise Test Suites for Large Software Product Lines

机译：绕过组合爆炸：使用相似性为大型软件产品线生成T-wise测试套件并确定其优先级

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Technical Report

机译：技术报告

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作者
Henard Christopher; Papadakis Mike; Perrouin Gilles; Klein Jacques; Heymans Patrick; Le Traon Yves;
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年度 2012
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原文格式 PDF
正文语种 en
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1. Bypassing the Combinatorial Explosion: Using Similarity to Generate and Prioritize T-Wise Test Configurations for Software Product Lines [J] . Henard C., Papadakis M., Perrouin G., Software Engineering, IEEE Transactions on . 2014 ,第7期

机译：绕开组合爆炸：使用相似性为软件产品线生成T-Wise测试配置并确定其优先级
2. T-wise combinatorial interaction test suites construction based on coverage inheritance [J] . Andrea Calvagna, Angelo Gargantini Software Testing, Verification and Reliability . 2012 ,第7期

机译：基于覆盖继承的T-wise组合交互测试套件构建
3. A Method for Prioritizing Integration Testing in Software Product Lines Based on Feature Model [J] . Zahra Akbari, Sedigheh Khoshnevis, Mehran Mohsenzadeh International journal of software engineering and knowledge engineering . 2017 ,第4期

机译：基于特征模型的软件产品线集成测试优先级排序方法
4. A Preliminary Empirical Assessment of Similarity for Combinatorial Iteraction Testing of Software Product Lines [C] . Stefan Fischer, Roberto E. Lopez-Herrejon, Rudolf Ramler, International Workshop on Search-Based Software Testing . 2016

机译：对软件产品线组合迭代测试相似性的初步经验评估
5. Combinatorial-based prioritization for user-session-based test suites [D] . Manchester, Schuyler 2012

机译：基于组合的优先级，用于基于用户会话的测试套件
6. Software Application Profile: RVPedigree: a suite of family-based rare variant association tests for normally and non-normally distributed quantitative traits [O] . Karim Oualkacha, Lajmi Lakhal-Chaieb, Celia MT Greenwood -1

机译：软件应用程序简介：RVPedigree：一套基于族的稀有变异关联测试用于正态和非正态分布的定量性状
7. Building T-wise Combinatorial Interaction Test Suites by means of Grid computing [O] . Andrea Calvagna, Angelo Gargantini, Emiliano Tramontana, 2012

机译：通过网格计算构建T-wise组合交互测试套件

Bypassing the Combinatorial Explosion: Using Similarity to Generate and Prioritize T-wise Test Suites for Large Software Product Lines

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