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Multi-site evaluation of a computer aided detection (CAD) algorithm for small acute intra-cranial hemorrhage and development of a stand-alone CAD system ready for deployment in a clinical environment

机译:用于小型急性颅内出血的计算机辅助检测(CaD)算法的多站点评估和开发可在临床环境中部署的独立CaD系统

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摘要

Timely detection of Acute Intra-cranial Hemorrhage (AIH) in an emergency environment is essential for the triage of patients suffering from Traumatic Brain Injury. Moreover, the small size of lesions and lack of experience on the reader's part could lead to difficulties in the detection of AIH. A CT based CAD algorithm for the detection of AIH has been developed in order to improve upon the current standard of identification and treatment of AIH. A retrospective analysis of the algorithm has already been carried out with 135 AIH CT studies with 135 matched normal head CT studies from the Los Angeles County General Hospital/ University of Southern California Hospital System (LAC/USC). In the next step, AIH studies have been collected from Walter Reed Army Medical Center, and are currently being processed using the AIH CAD system as part of implementing a multi-site assessment and evaluation of the performance of the algorithm. The sensitivity and specificity numbers from the Walter Reed study will be compared with the numbers from the LAC/USC study to determine if there are differences in the presentation and detection due to the difference in the nature of trauma between the two sites. Simultaneously, a stand-alone system with a user friendly GUI has been developed to facilitate implementation in a clinical setting. © 2010 Copyright SPIE - The International Society for Optical Engineering.
机译:在紧急情况下,及时发现急性颅内出血(AIH)对于对颅脑外伤患者进行分流至关重要。此外,病变的小尺寸和读者缺乏经验可能会导致AIH检测困难。为了改进目前对AIH的识别和治疗标准,已经开发了一种基于CT的AIH检测CAD算法。该算法的回顾性分析已经通过来自洛杉矶县总医院/南加州大学医院系统(LAC / USC)的135项AIH CT研究和135项匹配的正常头部CT研究进行了。下一步,已从沃尔特·里德陆军医疗中心收集了AIH研究,目前正在使用AIH CAD系统对其进行处理,作为对算法性能进行多站点评估和评估的一部分。将Walter Reed研究中的敏感性和特异性数值与LAC / USC研究中的数值进行比较,以确定由于两个部位之间创伤性质的不同,表现和检测方法是否存在差异。同时,已经开发了具有用户友好GUI的独立系统,以促进在临床环境中的实施。 ©2010版权所有SPIE-国际光学工程学会。

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