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Nature of the acceptor responsible for p-type conduction in liquid encapsulated Czochralski-grown undoped gallium antimonide

机译:负责液体包裹的Czochralski生长的未掺杂锑化镓中p型传导的受体的性质

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摘要

The acceptors in undoped liquid encapsulated Czochralski (LEC)-grown GaSb were investigated using temperature dependent Hall (TDH) and positron lifetime spectroscopy measurements. TDH measurements were performed on nonirradiated and electron irradiated undoped samples. The 34 meV acceptor was found to be the important one responsible for the p-type conduction in nonirradiated and the e--irradiated undoped materials annealed at temperatures up to 500°C. This acceptor was not related to any VGa-related defect detected and was most likely the GaSb antisite.
机译:使用温度依赖性霍尔(TDH)和正电子寿命光谱测量方法研究了未掺杂的液体封装的切克劳斯基(LEC)生长的GaSb中的受体。 TDH测量是在未辐照和电子辐照的未掺杂样品上进行的。发现34 meV受体是导致未辐照和电子辐照的未掺杂材料在高达500°C的温度下退火的p型传导的重要原因。该受体与检测到的任何与VGa相关的缺陷无关,很可能是GaSb反位点。

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