Application of a VUV fourier transform spectrometer and synchrotron radiation source to measurements of. VI. The ε(0,0) band of NO

摘要

The analysis of the ε(0,0) band around 187.6 nm was reported using the VUV FTS with synchrotron radiation for the background source. Due to the capability of the combintion of instruments, These were the first high-resolution quantitative measurements of line positions and intensities of the rotational lines of the ε(0,0) band. The determination of the band oscillator strengths of the band was performed using line-by-line measurements, because the resolution of the present experiment was comparable to the Doppler widths.