Thermal effect on current gains of an AlGaAs/GaAs heterostructure-emitter bipolar transistor

摘要

The temperature dependence of current gain was investigated for AlGaAs/GaAs heterostructure-emitter bipolar transistors (HEBT). The current gain of the HEBT was found much less sensitive to temperature variation than that of a heterojunction bipolar transistor. In particular, the HEBT current gain was more or less constant with increasing temperature at the high current regime, indicating great potentials for power applications.