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X ray and electron nondestructive spectroscopic methods for thin films and interfaces study Application to SrTiO3 based heterostructures

机译：用于薄膜和界面的X射线和电子无损光谱方法研究应用于基于srTiO3的异质结构

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Filatova E.O.; Kozhevnikov I.V.; Sokolov A.A.; Yegorova Yu.V.; Konashuk A.S.; Vilkov O.Yu.; Shulakov A.S.; Schaefers F.; Gorgoi M;
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1. X-ray and photoelectron spectroscopic nondestructive methods for thin films and interfaces study. Application to SrTiO_3 based heterostuctures [J] . E.O. Filatova, I.V. Kozhevnikov, A.A. Sokolov, Microelectronic Engineering . 2013,第sepa期

机译：X射线和光电子能谱法无损检测薄膜和界面的方法。在基于SrTiO_3的异质结构中的应用
2. Synchrotron radiation X-ray spectroscopic studies of interface electronic structure in molecular organic photovoltaic thin films [J] . K.E. Smith Journal of Electron Spectroscopy and Related Phenomena . 2013,第Pta1期

机译：分子有机光伏薄膜界面电子结构的同步辐射X射线光谱研究
3. Dielectric properties and X-ray photoelectron spectroscopic studies of niobium oxide thin films prepared by direct liquid injection chemical vapor deposition method [J] . Dinesh Chand Bharti, Shi-Woo Rhee Thin Solid Films . 2013,第deca2期

机译：直接液相注入化学气相沉积法制备氧化铌薄膜的介电性能和X射线光电子能谱研究
4. Spectroscopic detection of medium range order in hydrogenated amorphous Silicon, a-Si(H): applications in photovolatics, thin film transistors and Si-based microelectronics [C] . G. Lucovsky, G. Parsons, D. Zeller, International Conference on Solid State Chemistry . 2012

机译：氢化无定形硅中的中等范围顺序的光谱检测，A-Si（H）：在光散热物，薄膜晶体管和基于Si的微电子中的应用
5. X-ray Photoelectron Spectroscopy Studies of Solute Depth Distributions at the Liquid/Vapor Interface of Aqueous Solutions and Surface Structure of Pyrite Thin Films. [D] . Cheng, Ming Hsin. 2011

机译：X射线光电子能谱研究水溶液/液界面的溶质深度分布和黄铁矿薄膜的表面结构。
6. Broadband Dielectric Spectroscopic Characterization of Thermal Stability of Low-k Dielectric Thin Films for Micro- and Nanoelectronic Applications [O] . Christopher E. Sunday, Karl R. Montgomery, Papa K. Amoah, -1

机译：用于微和纳米电子应用的低k介电薄膜的热稳定性的宽带介电光谱表征
7. Study of oxide/metal/oxide thin films for transparent electronics and solar cells applications by spectroscopic ellipsometry [O] . Mihaela Girtan, Laura Hrostea, Mihaela Boclinca, 2017

机译：用光谱椭偏仪研究透明电子和太阳能电池应用的氧化物/金属/氧化物薄膜
8. Studies of ferroelectric heterostructure thin films and interfaces via in situ211 analytical techniques [R] . Auciello, O., Dhote, A., Gao, Y., 1999

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X ray and electron nondestructive spectroscopic methods for thin films and interfaces study Application to SrTiO3 based heterostructures

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