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High-precision pinpointing of luminescent targets in encoder-assisted scanning microscopy allowing high-speed quantitative analysis

机译:在编码器辅助扫描显微镜中高精度精确定位发光靶,可实现高速定量分析

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摘要

Compared with routine microscopy imaging of a few analytes at a time, rapid scanning through the whole sample area of a microscope slide to locate every single target object offers many advantages in terms of simplicity, speed, throughput, and potential for robust quantitative analysis. Existing techniques that accommodate solid-phase samples incorporating individual micrometer-sized targets generally rely on digital microscopy and image analysis, with intrinsically low throughput and reliability. Here, we report an advanced on-the-fly stage scanning method to achieve high-precision target location across the whole slide. By integrating X- and Y-axis linear encoders to a motorized stage as the virtual "grids" that provide real-time positional references, we demonstrate an orthogonal scanning automated microscopy (OSAM) technique which can search a coverslip area of 50 × 24 mm(2) in just 5.3 min and locate individual 15 μm lanthanide luminescent microspheres with standard deviations of 1.38 and 1.75 μm in X and Y directions. Alongside implementation of an autofocus unit that compensates the tilt of a slide in the Z-axis in real time, we increase the luminescence detection efficiency by 35% with an improved coefficient of variation. We demonstrate the capability of advanced OSAM for robust quantification of luminescence intensities and lifetimes for a variety of micrometer-scale luminescent targets, specifically single down-shifting and upconversion microspheres, crystalline microplates, and color-barcoded microrods, as well as quantitative suspension array assays of biotinylated-DNA functionalized upconversion nanoparticles.
机译:与一次对少量分析物进行常规显微镜成像相比,快速扫描整个显微镜载玻片的整个样品区域以定位每个单个目标物体,在简便性,速度,通量和强大的定量分析潜力方面均具有许多优势。容纳结合了单个微米级目标物的固相样品的现有技术通常依赖于数字显微镜和图像分析,其固有的低通量和可靠性。在这里,我们报告了一种先进的动态舞台扫描方法,可在整个幻灯片上实现高精度目标位置。通过将X和Y轴线性编码器集成到电动平台上,作为提供实时位置参考的虚拟“网格”,我们演示了正交扫描自动显微镜(OSAM)技术,该技术可以搜索50×24 mm的盖玻片区域(2)仅需5.3分钟,即可找到单个15μm镧系元素发光微球,其在X和Y方向的标准偏差为1.38和1.75μm。除了实现实时补偿幻灯片在Z轴上的倾斜的自动对焦单元外,我们还将发光检测效率提高了35%,并且变异系数得到了改善。我们展示了先进的OSAM能够对各种微米级发光目标(尤其是单个下移和上转换微球,晶体微板和色码微棒)进行定量的发光强度和寿命的可靠定量,以及定量悬浮阵列分析生物素化DNA功能化的上转换纳米颗粒的制备。

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