We present two test-data delivery optimization algorithmsfor system-on-chip (SOC) designs with hundreds of cores,where a network-on-chip (NOC) is used as the interconnectionfabric. We first present an e ective algorithm based on a subsetsumformulation to solve the test-delivery problem in NOCswith arbitrary topology that use dedicated routing. We furtherpropose an algorithm for the important class of NOCs with gridtopology and XY routing. The proposed algorithm is the first toco-optimize the number of access points, access-point locations,pin distribution to access points, and assignment of cores to accesspoints for optimal test resource utilization of such NOCs. Testtimeminimization is modeled as an NOC partitioning problemand solved with dynamic programming in polynomial time. Boththe proposed methods yield high-quality results and are scalableto large SOCs with many cores. We present results on syntheticgrid topology NOC-based SOCs constructed using cores fromthe ITC’02 benchmark, and demonstrate the scalability of ourapproach for two SOCs of the future, one with nearly 1,000 coresand the other with 1,600 cores. Test scheduling under powerconstraints is also incorporated in the optimization framework.
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