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Theory of electrostatic probe microscopy: A simple perturbative approach Electrostatic forces between sharp tips and metallic and dielectric samples

机译：静电探针显微镜理论：一种简单的摄动方法尖锐尖端与金属和介电样品之间的静电力

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机译：国际观众

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Gómez-Moñivas S; SÁenz J.; Carminati R.; Greffet J;
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1. Covaiently Functionalized Metallic Single-Walled Carbon Nanotubes Studied Using Electrostatic Force Microscopy and Dielectric Force Microscopy [J] . Kang Zhang, Nicola Marzari, Qing Zhang The journal of physical chemistry, C. Nanomaterials and interfaces . 2013,第46期

机译：使用静电力显微镜和介电力显微镜研究具有功能性的金属单壁碳纳米管
2. Electrostatic force gradient signal: resolution enhancement in electrostatic force microscopy and improved Kelvin probe microscopy [J] . A Gil, J Colchero, J Gomez-Herrero Nanotechnology . 2003,第2期

机译：静电力梯度信号：提高静电力显微镜的分辨率并改进开尔文探针显微镜
3. Quantitative electrostatic force microscopy with sharp silicon tips [J] . Fumagalli L., Edwards M. A., Gomila G. Nanotechnology . 2014,第49期

机译：带有尖锐硅尖端的定量静电力显微镜
4. Analysis of the forces in electrostatic force microscopy for profile measurement of micro-structured surface of dielectric [C] . Gaofa HE, Zhigang JIA, So ITO, International symposium on precision mechanical measurements . 2013

机译：静电力显微镜中力的分析，以测量电介质微结构表面的轮廓
5. High aspect ratio cantilever tips for non-contact electrostatic force microscopy [D] . Cockins, Lynda Patricia 2007

机译：用于非接触式静电力显微镜的高纵横比悬臂提示
6. Measurement of electrostatic tip–sample interactions by time-domain Kelvin probe force microscopy [O] . Christian Ritz, Tino Wagner, Andreas Stemmer 2020

机译：通过时域开尔文探针力显微镜测量静电尖端样品相互作用
7. Theory of electrostatic probe microscopy: A simple perturbative approach Electrostatic forces between sharp tips and metallic and dielectric samples [O] . Gómez-Moñivas S, SÁenz J., Carminati R., 2000

机译：静电探针显微镜理论：一种简单的摄动方法尖锐尖端与金属和介电样品之间的静电力

Theory of electrostatic probe microscopy: A simple perturbative approach Electrostatic forces between sharp tips and metallic and dielectric samples

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