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A low-cost, radiation-hardened method for pipeline protection in microprocessors

机译:一种低成本,辐射硬化的微处理器管道保护方法

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摘要

The aggressive scaling of semiconductor technology has significantly increased the radiation-induced soft error rate in modern microprocessors. Meanwhile, due to the increasing complexity of modern processor pipelines and the limited error-tolerance capabilities that previous radiation hardening techniques can provide, the existing pipeline protection mechanisms cannot achieve complete protection. This paper proposes a complete and cost-effective pipeline protection mechanism using a self-checking architecture. The radiation hardened pipeline is achieved by incorporating SETTOFF-based self-checking cells into the sequential cells of the pipeline. A replay recovery mechanism is also developed at the architectural level to recover the detected errors. The proposed pipeline protection technique is implemented in an OpenRISC microprocessor in 65nm technology. A gate-level transient fault injection and analysis technique is used to evaluate the error-tolerance capability of the proposed hardened pipeline design. The results show that compared to techniques such as TMR, the SETTOFF-based self-checking technique requires over 30% less area and 80% less power overheads. Meanwhile, the error-tolerant and self-checking capabilities of the register allow the proposed pipeline protection technique to provide a noticeably higher level of reliability for different parts of the pipeline compared to previous pipeline protection techniques.
机译:半导体技术的积极发展已大大提高了现代微处理器中辐射引起的软错误率。同时,由于现代处理器流水线的日益复杂以及以前的辐射强化技术可以提供的有限的容错能力,现有的流水线保护机制无法实现完整的保护。本文提出了一种使用自检体系结构的完整且经济高效的管道保护机制。通过将基于SETTOFF的自检单元合并到管道的顺序单元中,可以实现辐射硬化的管道。在体系结构级别上还开发了重播恢复机制,以恢复检测到的错误。所建议的管线保护技术在采用65nm技术的OpenRISC微处理器中实现。使用门级瞬态故障注入和分析技术来评估所提出的硬化管道设计的容错能力。结果表明,与TMR等技术相比,基于SETTOFF的自检技术所需的面积减少了30%以上,而电力开销却减少了80%。同时,寄存器的容错和自检功能使所提出的管线保护技术与以前的管线保护技术相比,可以为管线的不同部分提供明显更高的可靠性。

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