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Circuit-level modelling and simulation of carbon nanotube devices

机译:碳纳米管器件的电路级建模和仿真

摘要

The growing academic interest in carbon nanotubes (CNTs) as a promising novel class of electronic materials has led to significant progress in the understanding of CNT physics including ballistic and non-ballistic electron transport characteristics. Together with the increasing amount of theoretical analysis and experimental studies into the properties of CNT transistors, the need for corresponding modelling techniques has also grown rapidly. This research is focused on the electron transport characteristics of CNT transistors, with the aim to develop efficient techniquesto model and simulate CNT devices for logic circuit analysis.The contributions of this research can be summarised as follows. Firstly, to accelerate the evaluation of the equations that model a CNT transistor, while maintaining high modelling accuracy, three efficient numerical techniques based on piece-wise linear, quadratic polynomial and cubic spline approximation have been developed. The numerical approximation simplifies the solution of the CNT transistor’s self-consistent voltage such that the calculation of the drain-source current is accelerated by at least two orders of magnitude. The numerical approach eliminates complicated calculations in the modelling process and facilitates the development of fast and efficient CNT transistor models for circuit simulation.Secondly, non-ballistic CNT transistors have been considered, and extended circuit-level models which can capture both ballistic and non-ballistic electron transport phenomena, including elastic scattering, phonon scattering, strain and tunnelling effects, have been developed. A salient feature of the developed models is their ability to incorporate both ballistic and non-ballistic transport mechanisms without a significant computational cost. The developed models have been extensively validated against reported transport theories of CNT transistors and experimental results.Thirdly, the proposed carbon nanotube transistor models have been implemented on several platforms. The underlying algorithms have been developed and tested in MATLAB, behaviourallevel models in VHDL-AMS, and improved circuit-level models have been implemented in two versions of the SPICE simulator. As the final contribution of this work, parameter variation analysis has been carried out in SPICE3 to study the performance of the proposed circuit-level CNT transistor models in logic circuit analysis. Typical circuits, including inverters and adders, have been analysed to determine the dependence of the circuit’s correct operation on CNT parameter variation.
机译:碳纳米管(CNTs)作为一种有前途的新型电子材料,对学术界的兴趣日益浓厚,这导致人们对CNT物理包括弹道和非弹道电子传输特性的理解有了重大进展。随着越来越多的理论分析和对CNT晶体管特性的实验研究,对相应建模技术的需求也迅速增长。这项研究集中在CNT晶体管的电子传输特性上,目的是开发有效的技术来建模和仿真用于逻辑电路分析的CNT器件。本研究的贡献可总结如下。首先,为了在保持较高的建模精度的同时,加快对碳纳米管晶体管建模方程的评估,开发了基于分段线性,二次多项式和三次样条逼近的三种有效数值技术。数值近似简化了CNT晶体管自洽电压的求解,从而使漏-源电流的计算加速了至少两个数量级。数值方法消除了建模过程中的复杂计算,并促进了快速,高效的CNT晶体管模型的开发,从而可以进行电路仿真。其次,考虑了非弹道CNT晶体管,并扩展了可捕获弹道和非弹道的电路级模型。已经发展了包括弹性散射,声子散射,应变和隧穿效应在内的弹道电子传输现象。所开发的模型的显着特征是它们能够结合弹道和非弹道运输机制而无需大量的计算成本。所开发的模型已经针对报道的CNT晶体管的传输理论和实验结果进行了广泛的验证。第三,提出的碳纳米管晶体管模型已经在多个平台上实现。底层算法已在MATLAB中开发和测试,在VHDL-AMS中具有行为级模型,并且已在两个版本的SPICE模拟器中实现了改进的电路级模型。作为这项工作的最后贡献,在SPICE3中进行了参数变化分析,以研究所提出的电路级CNT晶体管模型在逻辑电路分析中的性能。已经对包括反相器和加法器在内的典型电路进行了分析,以确定该电路的正确操作对CNT参数变化的依赖性。

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  • 作者

    Zhou Dafeng;

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  • 年度 2010
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  • 原文格式 PDF
  • 正文语种 {"code":"en","name":"English","id":9}
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