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Transition from multiple to single microcontact conduction during hot switching of microelectromechanical switches with ball-shaped dimples

机译:在具有球形凹坑的微机电开关的热切换期间从多个微接触传导过渡到单个微接触传导

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摘要

Previous studies of electron transport within direct contact microelectromechanical switches have found that conduction occurs via nanoscale contact asperities. It has been claimed that reduced contact resistance can be achieved by using multiple contact switches; however, the ability of these switches to enhance power handling or lifetime remains a question. To study the contact mechanism, single-input-multiple-output switches with ball-shaped dimples were specially designed and tested. At all voltage levels of hot-switching operation, uneven current sharing among the outputs was observed. Furthermore, at softening voltage, an irreversible multiple to single conduction transition occurs and is found to alternate among different outputs.
机译:对直接接触微机电开关内的电子传输的先前研究发现,传导是通过纳米级接触粗糙体发生的。已经声称可以通过使用多个接触开关来实现降低的接触电阻。然而,这些开关增强功率处理能力或寿命的能力仍然是一个问题。为了研究接触机理,专门设计并测试了带有球形凹坑的单输入多输出开关。在热开关操作的所有电压电平下,观察到输出之间的电流分配不均。此外,在软化电压下,会发生不可逆的多次到单次传导跃迁,并且会在不同输出之间交替出现。

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