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Modeling of humidity-related reliability in enclosures with electronics

机译:与电子设备的外壳中湿度相关可靠性的建模

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摘要

Reliability of electronics that operate outdoor is strongly affected by environmental factors such as temperature and humidity. Fluctuations of these parameters can lead to water condensation inside enclosures. Therefore, modelling of humidity distribution in a container with air and freely exposed water is of importance for reliability engineering. Reliability assessment of large complex systems is often done by dividing the complex into decoupled subsystems. The reliability of such system is then obtained by combining the reliability of each subsystem. In this paper we set up a framework to predict humidity-related reliability of a printed circuit board (PCB) located in a cabinet by combining structural reliability methods and non-linear diffusion models. This framework can, thus, be used for reliability prediction from a climatic point-of-view. The proposed numerical approach is then tested to estimate the reliability of a case example with liquid water at the bottom of a cabinet and PCB positioned on one of the walls. The water vapor profile inside the enclosure is calculated using a diffusion equation whereas the release of vapor from the water surface is modeled using statistical rate theory. The novelty in this work lies within the reliability prediction based on physical modeling of the climate in the system of interest.
机译:在户外工作的电子设备的可靠性受温度和湿度等环境因素的强烈影响。这些参数的波动会导致机箱内的水凝结。因此,对具有空气和自由暴露的水的容器中的湿度分布进行建模对于可靠性工程非常重要。大型复杂系统的可靠性评估通常是通过将复杂的系统划分为解耦的子系统来完成的。然后通过组合每个子系统的可靠性来获得这种系统的可靠性。在本文中,我们建立了一个框架,通过结合结构可靠性方法和非线性扩散模型来预测位于机柜中的印刷电路板(PCB)的湿度相关可靠性。因此,该框架可用于从气候角度进行可靠性预测。然后,对所提出的数值方法进行测试,以评估案例示例的可靠性,该案例的示例是在柜体底部装有液态水,而PCB则位于其中一堵壁上。使用扩散方程计算外壳内部的水蒸气分布,而使用统计速率理论对水从表面释放的蒸气进行建模。这项工作的新颖性在于基于目标系统中气候物理模型的可靠性预测。

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