An automatic testing system to perform repetitive short-circuit tests on megawatt-scale IGBT power modules is pre-sented and described in this paper, pointing out the advantages and features of such testing approach. The developed system is based on a non-destructive short-circuit tester, which has been integrated with an advanced software tool and a semiconductor device analyzer to perform stress monitoring on the considered device under test (DUT). A case-study is included in the paper concerning a 1.7 kV/ 1 kA IGBT module, which has been tested safely up to 30,000 repetitions with no significant damage. The developed system has been demonstrated to be very helpful in performing a large number of repetition tests as required by modern testing protocols for robustness and reliability assess-ment. The software algorithm and a demonstration video are available for download.
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机译：本文提出并描述了一种自动测试系统，用于对兆瓦级IGBT电源模块进行重复的短路测试，并指出了这种测试方法的优势和特点。开发的系统基于无损短路测试仪，该测试仪已与先进的软件工具和半导体器件分析仪集成在一起，可以对考虑的被测器件（DUT）进行应力监控。该论文包括一个有关1.7 kV / 1 kA IGBT模块的案例研究，该模块已安全测试了30,000次重复，且无明显损坏。事实证明，开发的系统对执行大量重复测试非常有帮助，这是现代测试协议所要求的鲁棒性和可靠性评估。该软件算法和演示视频可供下载。
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