首页> 外文OA文献 >Reliability Studies of Flexible Polyimide Substrates with Flip-Chip Attachments and Electrical Test Structures
【2h】

Reliability Studies of Flexible Polyimide Substrates with Flip-Chip Attachments and Electrical Test Structures

机译:具有倒装芯片附件和电气测试结构的柔性聚酰亚胺基板的可靠性研究

摘要

Miniaturization of modern electronic devices has greatly increased the demand for advanced substrates for high-density applications, fine pitch attachment processes, and high-speed applications. Flexible polyimide (PI) PCBs have been popular in electronics packaging due to their pliability and good reliability at elevated temperatures. However, high moisture absorption of PI films may cause reliability issues in harsh conditions. Therefore, it is critical to understand the behavior of PI PCBs under such conditions.The aim of this work was to study the reliability of PI substrates using three accelerated life tests (ALTs) to examine possible reliability issues of PI under demanding conditions. A thermal cycling (T/C) test (-40 °C/125 °C) was performed for 5000 cycles. A high humidity test (85 °C / 85% RH) was performed for 4000 hours and the effect of corrosive humid environment was studied in a salt spray test for 4500 hours. Four test structures were used to study the reliability of the PI substrates. The reliability of flip chip attachment was studied using anisotropic conductive adhesive (ACA). The reliability of vias in PI substrate was also studied. Additionally, the stability of the dielectric properties of PI was studied using a parallel plated capacitor structure. Finally, meander structures were used to study the reliability of wiring on the PI substrates.The results showed that copper wirings on the PI PCB were highly reliable under temperature cycling and humid conditions. This revealed that 40% failures of the via struc-tures in the thermal cycling test were most likely caused by the via structures instead of the wiring in between them. However, the vias were not affected in the humid condi-tion. This showed that application of PI film for multilayer PCBs, where the vias are needed to interconnect the layers, might undergo reliability issues under service condi-tions with temperature cycling. However, PI film for multilayer PCBs would show high reliability under humid conditions. Moreover, the PI film was found to be a reliable substrate for chip attachment applications under temperature and humidity stresses. That is, flexible PI substrate are promising PCBs for fine pitch application. In addition, PI film as a dielectric was found to exhibit better electrical properties with lower dielectric constant after exposure to temperature cycling condition. However, high moisture ab-sorption of PI deteriorated the dielectric property of PI film by increasing its dielectric constant value. This showed that the PI substrates in high-speed applications are reliable under service conditions with cyclic temperature stresses. However, the functionality of the PI PCB may be declined in humid conditions. In this study, the harsh condition of the salt spray test considerably deteriorated the reliability of all PI test structures.
机译:现代电子设备的小型化极大地增加了对用于高密度应用,小间距连接工艺和高速应用的高级基板的需求。柔性聚酰亚胺(PI)PCB由于其柔韧性和在高温下的良好可靠性而在电子封装中广受欢迎。但是,PI膜的高吸湿性可能会在恶劣条件下引起可靠性问题。因此,了解PI PCB在这种情况下的行为至关重要。这项工作的目的是使用三种加速寿命试验(ALT)研究PI基板的可靠性,以检查在苛刻条件下PI可能存在的可靠性问题。进行了5000次循环的热循环(T / C)测试(-40°C / 125°C)。进行了4000个小时的高湿度测试(85°C / 85%RH),并在盐雾测试中研究了腐蚀潮湿环境的影响4,500个小时。四个测试结构用于研究PI基板的可靠性。使用各向异性导电胶(ACA)研究了倒装芯片连接的可靠性。还研究了PI基板中过孔的可靠性。此外,使用平行电镀电容器结构研究了PI介电性能的稳定性。最后,采用曲折结构研究PI基板上布线的可靠性,结果表明PI PCB上的铜布线在温度循环和潮湿条件下均高度可靠。这表明在热循环测试中,通孔结构的40%失效很可能是由通孔结构而不是它们之间的布线引起的。但是,通孔在潮湿条件下不受影响。这表明PI膜在多层PCB上的应用(需要通孔来互连各层)可能会在使用条件下随温度循环而发生可靠性问题。但是,用于多层PCB的PI膜在潮湿条件下会显示出高可靠性。此外,发现PI膜是在温度和湿度应力下用于芯片连接应用的可靠基材。也就是说,柔性PI基板是用于精细间距应用的有前途的PCB。另外,发现PI膜作为电介质在暴露于温度循环条件后具有较低的介电常数,具有更好的电性能。然而,PI的高吸湿性通过增加其介电常数值而使PI膜的介电性能恶化。这表明,高速应用中的PI基板在具有循环温度应力的工作条件下是可靠的。但是,在潮湿条件下,PI PCB的功能可能会下降。在这项研究中,盐雾测试的苛刻条件大大降低了所有PI测试结构的可靠性。

著录项

  • 作者

    Najari Masoud;

  • 作者单位
  • 年度 2015
  • 总页数
  • 原文格式 PDF
  • 正文语种 en
  • 中图分类

相似文献

  • 外文文献
  • 中文文献
  • 专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号