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Chemical functionalization and electronic passivation of gallium arsenide surfaces

机译:砷化镓表面的化学功能化和电子钝化

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摘要

Chemically controlled, low defect-density surfaces are essential for the incorporation of gallium arsenide into solar conversion and optoelectronic devices. Detailed X-ray photoelectron spectroscopic (XPS) studies have been conducted on chemically functionalized GaAs(111)A surfaces. Quantitative analysis of this surface after HCl(aq) etching reveals that it is completely free of observable oxide and As(0) contaminants, and is terminated with nearly a full monolayer of Cl. These surface Ga-Cl bonds have been reacted with the phosphine reagents PCl3 and PEt3, both of which introduce P atoms onto the surface. Direct reaction of PCl3 with the oxide-terminated surface leads to surfaces that are nearly oxide free but contain measurable amounts of As(0). Steady-state photoluminescence (PL) intensity measurements were used to evaluate the effectiveness of these techniques at passivating surface carrier recombination. Consistent with the chemical observations, etched and functionalized surfaces showed enhanced PL, while surfaces functionalized directly with PCl3 did not.ududThe effects of surface functionalization were explored on GaAs nanocrystals chemically synthsized with an oxide capping layer. Transmission electron microscopy and powder X-ray diffraction demonstrated that the particles were anisotropically etched by treatment with HCl(aq). XPS measurements showed that the Cl-terminated particles were almost entirely free of oxide but contained significant As(0) contamination. Further functionalization of the particles with N2H4 or NaSH replaced surface Cl atoms with N or S moieties but did not remove this As(0). The corresponding band gap PL of these particles was quite weak. Annealing the functionalized particles lead to the disappearance of the As(0) and strong enhancement of the PL intensity. These results imply that surface As(0) is a dominant carrier trap on nanoscale GaAs surfaces and should be broadly applicable for improving the performance of GaAs nanocrystals and nanowires.ududFinally, Fermi’s golden rule has been used to develop relationships between rate constants for electron transfer in donor-bridge-acceptor and electrode-bridge-acceptor systems and resistances across metal-bridge-electrode and metal-bridge-tip junctions. This formulation was used to predict resistances for alkanethiolate, oligophenylene, and DNA bridges from reported donor-acceptor electron-transfer measurements in these systems. These predicted values were compared to reported resistances measured for these molecules.
机译:化学控制的低缺陷密度表面对于将砷化镓掺入太阳能转换和光电设备至关重要。详细的X射线光电子能谱(XPS)研究已在化学功能化的GaAs(111)A表面上进行。 HCl(aq)蚀刻后对该表面的定量分析表明,它完全不含可观察到的氧化物和As(0)污染物,并以几乎完整的Cl单层终止。这些表面Ga-Cl键已经与膦试剂PCl3和PEt3反应,二者均将P原子引入到表面上。 PCl3与氧化物封端表面的直接反应导致表面几乎不含氧化物,但包含可测量量的As(0)。稳态光致发光(PL)强度测量用于评估这些技术在钝化表面载流子重组方面的有效性。与化学观察结果一致,蚀刻和功能化的表面显示出增强的PL,而直接用PCl3进行功能化的表面却没有。 ud ud探讨了表面功能化对化学合成有氧化物覆盖层的GaAs纳米晶体的影响。透射电子显微镜和粉末X射线衍射表明,通过用HCl(水溶液)处理,各向异性地蚀刻了颗粒。 XPS测量结果表明,Cl封端的颗粒几乎完全不含氧化物,但含有大量的As(0)污染。用N2H4或NaSH进一步对颗粒进行功能化,用N或S部分取代了表面Cl原子,但并未除去该As(0)。这些颗粒的相应带隙PL非常弱。退火功能化的粒子导致As(0)的消失和PL强度的强烈增强。这些结果表明,表面As(0)是纳米级GaAs表面上的主要载流子陷阱,应广泛应用于改善GaAs纳米晶体和纳米线的性能。 ud ud最后,费米黄金定律已被用于发展速率常数之间的关系。用于给体桥受体和电极桥受体系统中的电子转移,以及跨金属桥电极和金属桥尖结的电阻。该配方用于根据这些系统中已报道的供体-受体电子转移测量值预测链烷硫醇盐,低聚亚苯基和DNA桥的抗性。将这些预测值与针对这些分子测得的报告电阻进行比较。

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    Traub Matthew C.;

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